Reliability Data

This document contains reliability data on both commercial and military electronic components for use in reliability analyses. It contains failure rate data on integrated circuits, discrete semiconductors (diodes, transistors, optoelectronic devices), resistors, capacitors, and inductors/transformers, all of which were obtained from the field usage of electronic components. At 2,000 pages, the format of this document is the same as RIAC's popular NPRD document which contains reliability data on nonelectronic component types. A summary section presents failure rates sorted by generic component type, quality level and environment. A detailed section follows presenting component specific data including part number, manufacturer, package type, etc. Software version available.

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Nonelectronic Parts Reliability Data (NPRD) provides failure rates for a wide variety of component types including mechanical, electromechanical, and discrete electronic parts and assemblies. The document presents summary-level failure rates for numerous detailed part categories by environment and quality level. It contains 1,000 pages of data on over 25,000 parts. NPRD reflects field experience in military and commercial applications, concentrating on items not covered by other failure rate sources. This is an indispensable data source for engineers tasked to perform reliability analyses on system designs.

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This publication is a cumulative compendium of failure mode and mechanism data. The intent is to quantify these modes and mechanisms by providing their relative probabilities of occurrence. Data contained in this publication can be used to support reliability analyses such as an FMECA. When used in conjunction with a reliability prediction, failure rates can be apportioned among constituent failure modes. The distributions contained provide a baseline set of probabilities to be used in the reliability engineering industry. The scope of the publication is electrical, electronic, mechanical and electromechanical parts and assemblies.

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Electrostatic discharge (ESD) is a major cause of electronic device and system failures. This publication contains ESD susceptibility data for 22,000 devices, including microcircuits, discrete semiconductors and resistors. A detailed section contains the commercial part number, device description, manufacturer, ESD classification (per MIL-STD-1686A and MIL-STD-883 Method 3015.7), date code, data source information, resistance and capacitance used in the discharge circuit, failure voltage, pin combination, failure criteria, and the version of Method 3015 used. Interpretation of the data and profiles of susceptibility levels for various device types and technologies are included. This data is particularly useful in fulfilling part classification requirements and in the establishment of ESD control programs. Software version available.

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