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<title>Reliability Information Analysis Center (RIAC)</title>
<description>The Reliability Information Analysis Center (RIAC), formerly known as the Reliability Analysis Center (RAC), has served as a Department of Defense (DoD) Information Analysis Center (IAC) for more than 35 years. As an IAC, the RIAC is a Center of Excellence and technical focal point for information, data, analysis, training, and technical assistance in the engineering fields of Reliability, Maintainability, Quality, Supportability, and Interoperability (RMQSI).</description>
<link>http://theRIAC.org</link>
    <image>
		<title>Reliability Information Analysis Center (RIAC)</title>
        <url>http://theRIAC.org/rssfeeds/images/RIACLogo.png</url>
        <link>http://theRIAC.org</link>
    </image> 
<language>en-us</language>
<ttl>60</ttl>

<item>
<title>RIAC Desk Reference</title>
<description>

<![CDATA[<p>
<div style="float:left;">

<a href="http://theriac.org/DeskReference/Publications.php?selected=,1">
<img align="left" border="0" src="http://theRIAC.org/rssfeeds/images/RIAC_Desk_Ref_Logo.jpg" alt="RIAC Desk Reference" title="RIAC Desk Reference" style="margin:0 5px 5px 0" />
</a>
</div>
<div>
		<br><br><br><br><br>
		Offers a collection of RIAC publications in addition to helpful tools and articles to help you better understanding all aspects of Reliability, Maintainability, Quality, Supportability and Interoperability (RMQSI).
		<br><br>
		<font style="color: #ae0033; font-size:16px;">Get Started with our <a href="../DeskReference/Publications.php?selected=,1,2">Reliability Blueprints</a> to learn more about reliability & reliability practices.</font>
		<br>
		This 6 part series is designed for use in both the government and private sectors.
		It addresses products ranging from completely new commercial consumer products to highly specialized military systems. 
		</div>
		<br>
		<table border=0><tr><td valign='top'>
		<ul>
			<li><a href="../DeskReference/viewDocument.php?id=280&Scope=blueprints&Deskref=blueprint1">Defining Reliability Programs</a></li>
			<li><a href="../DeskReference/viewDocument.php?id=281&Scope=blueprints&Deskref=blueprint2">Developing Reliability Goals/Requirements</a></li>
			<li><a href="../DeskReference/viewDocument.php?id=282&Scope=blueprints&Deskref=blueprint3">Designing for Reliability</a></li>
		</ul>
		</td>
		<td valign='top'>
		<ul>
		<li><a href="../DeskReference/viewDocument.php?id=283&Scope=blueprints&Deskref=blueprint4">Assessing Reliability Progress</a></li>
		<li><a href="../DeskReference/viewDocument.php?id=284&Scope=blueprints&Deskref=blueprint5">Measuring Product Reliability</a></li>
		<li><a href="../DeskReference/viewDocument.php?id=285&Scope=blueprints&Deskref=blueprint6">Ensuring Reliable Performance</a></li>
		<ul>
		</td></tr></table>

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</description>
<link>http://theriac.org/DeskReference/Publications.php?selected=,1</link>
<guid isPermaLink="true">http://theriac.org/DeskReference/Publications.php?selected=,1</guid>
<pubDate>Tuesday, 16 Dec 2008 08:00:00 GMT</pubDate>
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<item>
<title>Physics-of-Failure Based Handbook of Microelectronic Systems</title>
<description>
<![CDATA[
<table border=0><tr><td>
<a href="http://theriac.org/riacapps/search/?mode=displayresult&id=678">
<img align="left" border="0" src="http://theRIAC.org/rssfeeds/images/BernsteinHandbookver3.png" alt="Physics-of-Failure Based Handbook of Microelectronic Systems cover" style="margin:0 5px 5px 0" />
</a>
</td><td>
This new publication presents a unique approach for microelectronic system reliability assessment and qualification based on physics-of-failure. The Handbook illustrates a very straightforward and common sense approach to reliability assessment that includes the well known property of constant rate failures that industry observes in the field with the mostly academic approach of physics-of-failures evaluation. Simply stated, the authors have developed a system by which a reliability engineer can take data from accelerated life testing that tests only a single mechanism, by design, and relate it to the proportion of constant rate failures that are observed in the field. Then, the results of both field data and test data can be used in order to more properly model the expected lifetime behavior of electronics as they operate under specified conditions. The work covers over seven years of research at the University of Maryland, College Park (in collaboration with Tel Aviv University and Bar Ilan University in Israel) that has been funded through the AVSI Aerospace Consortium run out of Texas A and M University, the Office of Naval Research, the US Department of Defense (DoD) and the Reliability Information Analysis Center (RIAC).
</td></tr><tr><td>
<b>Available formats:</b> 
<br>
Download
<br>
Hardcopy

</td><td>
<b>Price:</b>
<br>
$80 / $80 (Domestic/Foreign)
<br>
$100 / $100 (Domestic/Foreign)
<br>
</td></tr></table>
<a href="http://theriac.org/riacapps/search/?mode=displayresult&id=678">Order Now</a>
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</description>

<link>http://theriac.org/riacapps/search/&#63;mode=displayresult&#38;id=678</link>
<pubDate>Mon, 13 Oct 2008 08:00:00 GMT</pubDate>
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<title>Introduction to Maintainability Engineering On-line Training Course</title>
<description>
<![CDATA[
<table border=0 width="96%"><tr><td width="25%" align="center">
<b>Instructor:</b> 
<br> 
Ned H. Criscimagna 
<br>
<a href="../../riacapps/search/?mode=displayresult&id=679"><img src="http://www.theriac.org/productsandservices/training/online/VideoPresentations/Maintainability/maintainability_screenshots/section1.jpg" alt="Flash Verison" width="210" height="150" border="3" style="padding:0px; border: #666666 solid" /></a>
        		<!-- Duration -->
                <div style="padding-top: 5px; text-align: center; width: 220px;">
                    <em>Demo 1 - Duration:</em> 0:06:20
                    <br>
                    <em>Demo 2 - Duration:</em> 0:19:57
                    <BR>
                    <BR>
                    <a href="../../riacapps/search/?mode=displayresult&id=679">Order Now</a>
</td><td valign="top">
<b>Course Description:</b> 
<br> 
This course was developed by Quanterion Solutions Inc. (under the DoD Reliability Information Analysis Center (RIAC) contract) as an introduction to maintainability engineering concepts and practices. It covers basic maintainability concepts, definitions, elements of a comprehensive maintainability program, mathematical foundations, maintainability design and verification approaches. The course also includes two quizzes to reinforce the concepts covered.

</td></tr>
<tr><td valing="top">
			<b>View the Demos</b>
            <ul style="margin-bottom:0px;">
          
                <li><a href="http://www.theriac.org/productsandservices/training/online/VideoPresentations/Maintainability/introduction-to-maintainability/" target="_blank">Demo 1</a> - Introduction</li>
       	        <li><a href="http://www.theriac.org/productsandservices/training/online/VideoPresentations/Maintainability/introduction-to-maintainability-section3-Demo2/" target="_blank">Demo 2</a> - Introduction to Maintainability Concepts</li>
			</ul>
			<em>Demos are cutout sections of the actual course</em>

</td><td valing="top">
  <b>Features & Benefits</b>
            <ul style="margin-bottom:0px;">
          
                <li>3 Days of live recorded feed including quizzes and demos, totaling over 14 Hours</li>
                <li>Synchronized PowerPoint presentations with video for maximum learning content</li>
                <li>On-Line training lets you learn at your own pace, anywhere, anytime, and save lots of money on travel expenses</li>
                <li>Get instant access for only $299</li>
            
			</ul>
			<br>
		<!--<a href="online/VideoPresentations/introduction-to-maintainability/" target="_blank">View the Demo</a> -->
		
 
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</table>

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</description>
<link>http://www.theriac.org/productsandservices/training/#DistanceLearning</link>
<pubDate>Mon, 13 Oct 2008 08:00:00 GMT</pubDate>
</item>


<item>
<title>RIAC Third Quarter 2008 Journal is now available Online</title>
<description>
<![CDATA[

<TABLE STYLE="width:560px;height:175px;font-size: 11px;font-family: verdana,arial,sans;"><TR></TR><TR><TD>&nbsp;</TD><TD align=left><div class="wrap1" style="width:155px"><div class="wrap2"><div class="wrap3"><img src="../../DeskReference/PDFs/2008Q3/animated2008q3.gif" alt="Journal Cover" title="Journal Cover" width=143 height=185 /></div></div></div></TD><TD valign=center><div STYLE="overflow:auto;font-size: 11px;font-family: verdana,arial,sans;" valign=center><BR>Contains the following Articles:<BR><UL><LI><a href="/DeskReference/viewDocument.php?id=316&Scope=journal&year=2008&Q=3">Highlighting the New RIAC Website</a><LI><a href="/DeskReference/viewDocument.php?id=317&Scope=journal&year=2008&Q=3">Spares Optimization Algorithm for Calculating Recommended Spares</a><LI><a href="/DeskReference/viewDocument.php?id=318&Scope=journal&year=2008&Q=3">Predicting Reliability of MMICs Using Monte Carlo Analytical Techniques (Part 3 of 3)</a><LI><a href="/DeskReference/viewDocument.php?id=319&Scope=journal&year=2008&Q=3">The RIAC 217PlusTM Transistor and Thyristor Failure Rate Models</a></UL><BR>To view previous RIAC Journals <a href="../../riacapps/journal/">click here</a></div></TD></TR></TABLE>

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</description>
<link>http://theRIAC.org/DeskReference/PDFs/2008Q3/RIAC2008_3QforWeb.pdf</link>
<pubDate>Mon, 13 Oct 2008 08:00:00 GMT</pubDate>
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<copyright>Copyright (c) theRIAC.org 2008</copyright>
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